Issue |
Europhys. Lett.
Volume 33, Number 3, January III 1996
|
|
---|---|---|
Page(s) | 205 - 210 | |
Section | Condensed matter: structure, thermal and mechanical properties | |
DOI | https://doi.org/10.1209/epl/i1996-00322-3 | |
Published online | 01 September 2002 |
X-ray diffraction study of the stacking faults in hexagonal C70 single crystals
1
Institute of Crystallography, University of Lausanne BSP, CH-1015 Lausanne,
Switzerland
2
Laboratory of Crystallography, University of Bern Freiestrasse 3,
CH-3012 Bern, Switzerland
Received:
31
July
1995
Accepted:
6
December
1995
Pure crystallizes in close-packed crystal structures. Both the
hexagonal close packing (h.c.p.) and the cubic close packing (c.c.p.) are
known to exist. X-ray diffraction from single crystals with hexagonal
habitus shows rods of diffuse intensity typical of stacking faults. The
intensities of three of these rods were measured at room temperature with
synchrotron radiation, and interpreted with a growth fault model assuming a
depth of interaction of three layers. The result indicates the presence of
both h.c.p. and c.c.p. domains, the former containing fewer stacking faults
than the latter. The probability to find an
stack of three layers (
e.g., ABA) anywhere in the crystal is only about 60%.
PACS: 61.72.Dd – Experimental determination of defects by diffraction and scattering / 61.72.Nn – Stacking faults and other planar or extended defects / 61.66.Bi – Elemental solids
© EDP Sciences, 1996
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