Volume 36, Number 4, November I 1996
|Page(s)||265 - 270|
|Section||Condensed matter: structure, thermal and mechanical properties|
|Published online||01 September 2002|
Determination of small fluctuations in electron density profiles of thin films: Layer formation in a polystyrene film
Saha Institute of Nuclear Physics - 1/AF, Bidhannagar, Calcutta-700 064,
Accepted: 16 September 1996
A spin-coated thin polystyrene film on a silicon single crystal has been studied using the X-ray reflectivity technique. Signature of layering as a function of depth, due to confinement, in this polystyrene film could be detected from the reflectivity profile using a new analysis scheme. Small variations of electron density across the depth of a thin film can be determined from reflectivity data using this scheme with no a priori distribution of electron density profile.
PACS: 61.10.-i – X-ray diffraction and scattering / 61.25.Hq – Macromolecular and polymer solutions; polymer melts / 68.35.-p – Solid surfaces and solid-solid interfaces
© EDP Sciences, 1996
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