| Issue |
Europhys. Lett.
Volume 36, Number 4, November I 1996
|
|
|---|---|---|
| Page(s) | 265 - 270 | |
| Section | Condensed matter: structure, thermal and mechanical properties | |
| DOI | https://doi.org/10.1209/epl/i1996-00220-2 | |
| Published online | 01 September 2002 | |
Determination of small fluctuations in electron density profiles of thin films: Layer formation in a polystyrene film
Saha Institute of Nuclear Physics - 1/AF, Bidhannagar, Calcutta-700 064,
India
Received:
1
April
1996
Accepted:
16
September
1996
A spin-coated thin polystyrene film on a silicon single crystal has been studied using the X-ray reflectivity technique. Signature of layering as a function of depth, due to confinement, in this polystyrene film could be detected from the reflectivity profile using a new analysis scheme. Small variations of electron density across the depth of a thin film can be determined from reflectivity data using this scheme with no a priori distribution of electron density profile.
PACS: 61.10.-i – X-ray diffraction and scattering / 61.25.Hq – Macromolecular and polymer solutions; polymer melts / 68.35.-p – Solid surfaces and solid-solid interfaces
© EDP Sciences, 1996
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