Volume 36, Number 6, November III 1996
|Page(s)||467 - 472|
|Section||Cross-disciplinary physics and related areas of science and technology|
|Published online||01 September 2002|
In-plane penetration depth of high-temperature superconductors with single and double CuO layers
Physikalisches Institut, Lehrstuhl Experimentalphysik II,
Universität Tübingen, Morgenstelle 14, D-72076 Tübingen,
2 II. Physikalisches Institut, Lehrstuhl Experimentalphysik II, Universität zu Köln, Zülpicherstr. 77, D-50937 Köln, Germany
3 NTT Basic Research Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 243, Japan
Accepted: 10 October 1996
A dc technique based on the measurement of the magnetic-field dependence of the critical current of bicrystal grain boundary Josephson junctions (GBJs) is used to precisely determine the temperature change of the in-plane London penetration depth of ybco (YBCO) and lsco (LSCO) thin films. The resolution of the applied measuring technique is better than 0.2 Å and the measured dependences are not sensitive to extrinsic influences. Over a wide temperature range the data obtained for different high-temperature superconductors confirm with high accuracy the theoretical prediction for a -symmetry of the superconducting order parameter. The same temperature dependence is measured for materials with single and double CuO layers.
PACS: 85.25.Cp – Josephson devices / 74.50.+r – Proximity effects, weak links, tunneling phenomena, and Josephson effects / 85.70.-w – Magnetic devices
© EDP Sciences, 1996
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