| Issue |
Europhys. Lett.
Volume 38, Number 2, April II 1997
|
|
|---|---|---|
| Page(s) | 97 - 102 | |
| Section | Condensed matter: structure, thermal and mechanical properties | |
| DOI | https://doi.org/10.1209/epl/i1997-00207-5 | |
| Published online | 01 September 2002 | |
The resistance of a (Xe)n atomic wire
1
Centre d'Élaboration de Matériaux et d'Études Structurales, UPR CNRS 8011, 29, rue Jeanne-Marvig, B.P. 4347, F-31055 Toulouse Cedex 4, France
2
Laboratoire de Physique Moléculaire, URA CNRS 772, Université de Franche-Comté - F-25030 Besançon Cedex, France
Received:
6
January
1997
Accepted:
28
February
1997
The electrical resistances of different 
atomic wires are
calculated. For Xe and 
, confined in the gap of a scanning
tunneling microscope junction, the dynamics of the xenon atoms upon approaching
the probe tip is included. With a single Xe, in agreement with the recent work
of Yazdani et al. (Science, 272 (1996) 1921), a resistance of
is found. The resistance of 
ranges between 
and 
due to both mechanical deformations and electronic interferences.
Finally, for longer wires, the resistance displays an exponential
behavior with respect to n and an inverse damping length of
, very close to that of an alkane chain, is predicted.
PACS: 61.16.Ch – Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc / 61.20.Lc – Time-dependent properties; relaxation / 72.80.-r – Conductivity of specific materials
© EDP Sciences, 1997
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