Issue |
Europhys. Lett.
Volume 44, Number 1, October I 1998
|
|
---|---|---|
Page(s) | 74 - 79 | |
Section | Condensed matter: electronic structure, electrical, magnetic and optical properties | |
DOI | https://doi.org/10.1209/epl/i1998-00437-y | |
Published online | 01 September 2002 |
Kondo size effect in thin Cu(Mn) films
Department of Physics, Purdue University, West Lafayette, Indiana 47907-1396, USA
Received:
11
May
1998
Accepted:
7
August
1998
We report an experimental study of the Kondo effect in thin
Cu(Mn) films. Previous experiments with Au(Fe) and Cu(Fe) films have
shown that in those systems the Kondo contribution to the
resistivity, ,
becomes smaller as the film thickness, t, is reduced below about
, and that it vanishes as
. However,
the behavior we find for Cu(Mn) is very different.
In this case
varies only weakly (and perhaps not
at all) with t, and
approaches a nonzero value as
.
These results are in good agreement with recent theoretical
predictions of Zawadowski and coworkers.
PACS: 72.10.Di – Scattering by phonons, magnons, and other nonlocalized excitations / 72.15.Rn – Quantum localization / 73.20.Fz – Weak localization effects (e.g., quantized states)
© EDP Sciences, 1998
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.