Issue |
Europhys. Lett.
Volume 45, Number 2, January 1999
|
|
---|---|---|
Page(s) | 201 - 207 | |
Section | Condensed matter: structure, thermal and mechanical properties | |
DOI | https://doi.org/10.1209/epl/i1999-00147-6 | |
Published online | 01 September 2002 |
Ultra-low concentration phase separation in solids: Ag in (Cd, Hg)Te
Department of Materials and Interfaces, Weizmann Institute of Science Rehovot,
76100 Israel
Received:
3
July
1998
Accepted:
12
November
1998
We show how phase separation, in the form of a redistribution of impurities (dopants in a semiconductor), can occur at impurity concentrations that are more than one order of magnitude lower than hitherto observed. This phenomenon results from the balance between long-range electrostatic repulsion and the elastic attraction of the dopants, which deforms the anisotropic host lattice.We observed such a phase separation for Ag in (Cd, Hg)Te at Ag concentrations < 0.02 at. %. This also leads to the formation of a thermodynamically (as opposed to kinetically) stable p-n junction in the 2-phase region. Searching for phase separation at such low concentrations requires highly sensitive analyses, here made possible because of the difference in conductivity type between the phases.
PACS: 64.75.+g – Solubility, segregation, and mixing; phase separation / 61.72.Vv – Doping and impurity implantation in III-V and II-VI semiconductors / 66.30.-h – Diffusion in solids
© EDP Sciences, 1999
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.