| Issue |
Europhys. Lett.
Volume 46, Number 5, June I 1999
|
|
|---|---|---|
| Page(s) | 649 - 654 | |
| Section | Condensed matter: structure, mechanical and thermal properties | |
| DOI | https://doi.org/10.1209/epl/i1999-00309-6 | |
| Published online | 01 September 2002 | |
Glass transition temperature and dynamics of α-process in thin polymer films
Faculty of Integrated Human Studies,
Kyoto University - Kyoto, 606-8501 Japan
Received:
4
January
1999
Accepted:
30
March
1999
The glass transition temperature Tg and the temperature
corresponding to the peak in the dielectric loss
due to the α-process
have been simultaneously determined as functions of the film thickness d
through dielectric measurements for thin films of polystyrene.
A decrease of Tg was observed with decreasing film thickness,
while was found to remain almost constant for 
and
decrease drastically for 
. Here, dc is a critical
thickness dependent on molecular weight. The thickness dependence of
Tg is related to the distribution of the relaxation times of the
α-process, not to the relaxation time itself.
PACS: 64.70.Pf – Glass transitions / 68.60.-p – Physical properties of thin films, nonelectronic / 77.22.Gm – Dielectric loss and relaxation
© EDP Sciences, 1999
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