Volume 50, Number 6, June II 2000
|Page(s)||742 - 748|
|Section||Condensed matter: structure, mechanical and thermal properties|
|Published online||01 September 2002|
Scanning force microscopy corrected for -scale sample elasticity on single latent heavy-ion tracks in polymers
Gesellschaft für Schwerionenforschung (GSI), Department of Materials Research
Planckstr. 1, 64291 Darmstadt, Germany
Corresponding author: firstname.lastname@example.org
Accepted: 13 April 2000
SFM-images of latent tracks of single high-energy (11.4 MeV/n) heavy ions (Au, Bi, Pb) on the surface of polymer foils (PI, PET) reveal 15-20 nm sized ring-shaped delicate structures, only visible when minimizing the imaging forces down to or below in a liquid environment. For obtaining here a true 3D topographic map by SFM, the heights are corrected with respect to nm-scale sample elasticity. Quantifying this effect, which on a polymer can cause the measured heights to be artificially increased by a factor up to 2-4 and on a mica substrate still up to a factor of 2, is essential whenever exploiting the SFM's powerful capability of quantifying heights and spring constants on soft samples on a nm lateral scale.
PACS: 61.16.Ch – Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc / 61.80.Jh – Ion radiation effects / 68.10.Et – Interface elasticity, viscosity, and viscoelasticity
© EDP Sciences, 2000
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.