| Issue |
Europhys. Lett.
Volume 50, Number 6, June II 2000
|
|
|---|---|---|
| Page(s) | 742 - 748 | |
| Section | Condensed matter: structure, mechanical and thermal properties | |
| DOI | https://doi.org/10.1209/epl/i2000-00543-x | |
| Published online | 01 September 2002 | |
Scanning force microscopy corrected for 
-scale sample
elasticity on single latent heavy-ion tracks in polymers
Gesellschaft für Schwerionenforschung (GSI), Department of Materials Research
Planckstr. 1, 64291 Darmstadt, Germany
Corresponding author: 104666.375@compuserve.com
Received:
1
October
1999
Accepted:
13
April
2000
SFM-images of latent tracks of single high-energy (11.4 MeV/n) heavy ions
(Au, Bi, Pb) on the surface of polymer foils (PI, PET) reveal 15-20 nm sized
ring-shaped delicate structures, only visible when minimizing the imaging
forces down to 
or below in a liquid environment. For obtaining here
a true 3D topographic map by SFM, the heights are corrected with respect
to nm-scale sample elasticity. Quantifying this effect, which on a polymer
can cause the measured heights to be artificially increased by a factor up
to 2-4 and on a mica substrate still up to a factor of 2, is essential whenever
exploiting the SFM's powerful capability of quantifying heights and spring
constants on soft samples on a nm lateral scale.
PACS: 61.16.Ch – Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc / 61.80.Jh – Ion radiation effects / 68.10.Et – Interface elasticity, viscosity, and viscoelasticity
© EDP Sciences, 2000
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