Volume 50, Number 6, June II 2000
|Page(s)||742 - 748|
|Section||Condensed matter: structure, mechanical and thermal properties|
|Published online||01 September 2002|
Scanning force microscopy corrected for -scale sample elasticity on single latent heavy-ion tracks in polymers
Gesellschaft für Schwerionenforschung (GSI), Department of Materials Research
Planckstr. 1, 64291 Darmstadt, Germany
Corresponding author: email@example.com
Accepted: 13 April 2000
SFM-images of latent tracks of single high-energy (11.4 MeV/n) heavy ions (Au, Bi, Pb) on the surface of polymer foils (PI, PET) reveal 15-20 nm sized ring-shaped delicate structures, only visible when minimizing the imaging forces down to or below in a liquid environment. For obtaining here a true 3D topographic map by SFM, the heights are corrected with respect to nm-scale sample elasticity. Quantifying this effect, which on a polymer can cause the measured heights to be artificially increased by a factor up to 2-4 and on a mica substrate still up to a factor of 2, is essential whenever exploiting the SFM's powerful capability of quantifying heights and spring constants on soft samples on a nm lateral scale.
PACS: 61.16.Ch – Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc / 61.80.Jh – Ion radiation effects / 68.10.Et – Interface elasticity, viscosity, and viscoelasticity
© EDP Sciences, 2000
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