| Issue |
Europhys. Lett.
Volume 51, Number 1, July I 2000
|
|
|---|---|---|
| Page(s) | 75 - 81 | |
| Section | Condensed matter: structure, mechanical and thermal properties | |
| DOI | https://doi.org/10.1209/epl/i2000-00339-6 | |
| Published online | 01 September 2002 | |
Isotope effect of 
diffusion in thin amorphous 
layers during structural relaxation
1
Lehrstuhl für Materialverbunde, Technische Fakultät der Universität
Kiel
Kaiserstraße 2, D-24143 Kiel, Germany
2
Institut für Metallphysik, Universität Göttingen
Hospitalstraße 3-7, D-37073 Göttingen, Germany
Corresponding author: ff@techfak.uni-kiel.de
Received:
17
January
2000
Accepted:
3
May
2000
The time dependence and the isotope effect
of Co diffusion have been measured in amorphous
during
structural relaxation. The radiotracer technique in conjunction with serial sectioning using
ion-beam sputtering was employed to observe diffusion on a nanometer scale. A drastic drop of
diffusivity during structural relaxation in these thin films was found which
is of the same order of magnitude observed in much thicker
glasses(Dörner W. and Mehrer H., Phys. Rev. B, 44
(1991) 101). This seems to rule out
annihilation of quenched-in free volume at the outer surface. In contrast to measurements in
melt-spun amorphous
,
where a change in E from
in the as-quenched state to 
in the relaxed state has been measured
(Rätzke K.
et. al., Phys. Rev. Lett., 68 (1992) 2347), no change in E
has been observed in
during structural relaxation. The low value of E =0.01(2) in the
relaxed and even in the as-quenched state in the present alloy strongly suggests
collective diffusion mechanisms in the relaxed and also as-quenched state.
PACS: 61.43.-j – Disordered solids / 66.30.Fq – Self-diffusion in metals, semimetals, and alloys / 72.15.Lh – Relaxation times and mean free paths
© EDP Sciences, 2000
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