Issue |
Europhys. Lett.
Volume 51, Number 5, September I 2000
|
|
---|---|---|
Page(s) | 527 - 533 | |
Section | Condensed matter: structure, mechanical and thermal properties | |
DOI | https://doi.org/10.1209/epl/i2000-00370-1 | |
Published online | 01 September 2002 |
Scanning tunneling spectroscopy
on the
surface
1
Institute of Solid State Physics RAS
142432 Chernogolovka, Moscow district, Russia
2
Friedrich-Schiller-Universität Jena, Institut für
Festkörperphysik
Max-Wien-Platz 1, D-07743 Jena, Germany
Corresponding author: vgasparo@issp.ac.ru
Received:
7
December
1999
Accepted:
4
July
2000
Surface topographic (STM) and spectroscopic (STS) studies have been
performed on the -terminated
-
surface using a scanning tunneling microscope (STM) in ultrahigh vacuum. High-quality
(
) overstructures have been prepared as observed by LEED
and STM. The regular (
) surface sites revealed much weaker I(V) dependences as
compared to the defect sites when measured using the constant tip-surface gap technique. The
normalized
vs. V spectra exhibit distinct bands of empty and filled
states, which are separated by
for both surface sites, respectively.
The results thereby support a Mott-Hubbard-type model as used for the
calculation of the density of states. However, the STS spectra become
completely featureless in the range of small tip-surface distances and
reveal a “metallic”-like Ohmic I-V dependence.
PACS: 61.16.Ch – Scanning probe microscopy: scanning tunneling, atomic force, etc / 73.20.At – Surface states, band structure, electron density of states / 79.60.Bm – Clean metal, semiconductor, and insulator surfaces
© EDP Sciences, 2000
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