Volume 52, Number 3, November I 2000
|Page(s)||330 - 336|
|Section||Condensed matter: structure, mechanical and thermal properties|
|Published online||01 September 2002|
Evidence for density anomalies of liquids at the solid/liquid interface
Institut für Experimentelle und Angewandte Physik, Universität Kiel
Leibnizstraße 17-19, 24098 Kiel, Germany
Accepted: 12 September 2000
We show that the density of liquids is altered significantly next to a hard wall. Thin films of van der Waals liquids on silicon substrates have been prepared and investigated by means of X-ray reflectivity. This probe yields density profiles on an ångstrom scale. The region next to the substrates is highly sensitive to the shape of the molecules of the liquid. Our results are in agreement with published density functional calculations. Small, almost spherical molecules exhibit a one-dimensional ordering perpendicular to the surface while more complex molecules lead to a low-density region in the vicinity of the substrate.
PACS: 68.15.+e – Liquid thin films / 61.41.+e – Polymers, elastomers, and plastics / 68.45.Gd – Wetting
© EDP Sciences, 2000
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