Volume 54, Number 1, April 2001
|Page(s)||98 - 104|
|Section||Condensed matter: electronic structure, electrical, magnetic, and optical properties|
|Published online||01 December 2003|
Fizeau's interferometer device in thin superconducting films
Centre de Recherches sur les Très Basses Températures
Laboratoire Associé à l'Université Joseph Fourier,
CNRS BP 166, 38042 Grenoble-Cédex 9, France
2 Departamento de Física, Pontifícia Universidade Católica do Rio de Janeiro Rio de Janeiro 22452-970 RJ, Brazil
3 Instituto de Física, Universidade Federal do Rio de Janeiro C.P. 68528 Rio de Janeiro 21945-970 RJ, Brazil
Accepted: 18 December 2000
We propose here that thin superconducting films, deposited on a substrate of high dielectric constant, be used in Fizeau's experiment, which probes how light propagates inside a drifting charged condensate. We predict that the phase shift of the propagating light is well described by an effective London length, and is proportional to , where v0 is the superfluid velocity and the phase velocity of the propagating mode. We claim that thin films grown on form a system where this phase shift is large enough to be measured.
PACS: 75.30.Mb – Valence fluctuation, Kondo lattice, and heavy-fermion phenomena / 74.10.+v – Occurrence, potential candidates / 74.25.Gz – Optical properties
© EDP Sciences, 2001
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