Issue |
Europhys. Lett.
Volume 54, Number 3, May 2001
|
|
---|---|---|
Page(s) | 387 - 393 | |
Section | Condensed matter: electronic structure, electrical, magnetic, and optical properties | |
DOI | https://doi.org/10.1209/epl/i2001-00254-x | |
Published online | 01 December 2003 |
A comparative analysis of
grain boundary
junctions modified by oxygen annealings and
irradiation
1
Centro de Estudios Superiores Felipe II c/Capitán 39, 28300 Aranjuez,
Madrid, Spain
2
Departamento de Física Aplicada III, Facultad de Ciencias Físicas
Universidad Complutense, 28040 Madrid, Spain
Received:
17
April
2000
Accepted:
23
February
2001
In order to bring new data about the physics of the microscopic
(YBCO) grain boundary mechanism, we have used two
different ways to induce modifications in the oxygen sublattice of grain boundary
Josephson junctions (GBJs): annealings and irradiation with helium at 80
of
both electrodes and barrier. We present a comparative study in terms of the main
electromagnetic and transport parameters between irradiated and oxygen-deficient
junctions with the same critical temperature. In irradiated junctions the coupling
energy of the barrier can be enhanced when the superconducting properties of the
electrodes are not severely degraded. The modification of the barrier properties
depends on the dose and on the particular distribution of the critical current inside
the barrier. Changes of the ratio of the relative dielectric constant to the barrier
thickness (
) upon irradiation are mainly due to changes in
ε, and progress in the same direction as the normal resistance
(
). On the other hand, a reduction of the oxygen content by annealing of
YBCO thin film always causes a degradation of the barrier coupling energy.
increases along with both ε and t.
PACS: 74.50.+r – Proximity effects, weak links, tunneling phenomena, and Josephson effects
© EDP Sciences, 2001
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