This article has an erratum: [https://doi.org/10.1209/epl/i2002-00577-6]
Volume 55, Number 2, July 2001
|Page(s)||228 - 234|
|Section||Interdisciplinary physics and related areas of science and technology|
|Published online||01 December 2003|
Relaxation of a moving contact line and the Landau-Levich effect
Laboratoire de Physique de la Matière Condensée, Collège de France
URA No. 792 du CNRS - 11 place Marcelin-Berthelot, 75231 Paris Cedex 05, France
2 Institute for Theoretical Physics, University of California Santa Barbara, CA 93106-4030, USA
3 Institute for Studies in Theoretical Physics and Mathematics P.O. Box 19395-5531, Tehran, Iran
Accepted: 7 May 2001
The dynamics of the deformations of a moving contact line is formulated. It is shown that an advancing contact line relaxes more quickly as compared to the equilibrium case, while for a receding contact line there is a corresponding slowing down. For a receding contact line on a heterogeneous solid surface, it is found that a roughening transition takes place which formally corresponds to the onset of leaving a Landau-Levich film. We propose a phase diagram for the system in which the phase boundaries corresponding to the roughening transition and the depinning transition meet at a junction point, and suggest that for sufficiently strong disorder a receding contact line will leave a Landau-Levich film immediately after depinning.
PACS: 68.08.Bc – Wetting / 68.08.-p – Liquid-solid interfaces / 05.40.-a – Fluctuation phenomena, random processes, noise, and Brownian motion
© EDP Sciences, 2001
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