Volume 56, Number 2, October 2001
|Page(s)||241 - 246|
|Section||Condensed matter: structural, mechanical and thermal properties|
|Published online||01 December 2003|
Real-part EXAFS from multilayer Bragg reflections: A promising new EXAFS technique
Swiss Light Source, Paul Scherrer Institute - CH-5232
Villigen PSI, Switzerland
2 Laboratory for Neutron Scattering, Paul Scherrer Institute CH-5232, Villigen PSI, Switzerland
3 Istituto Nazionale per la Fisica della Materia (INFM), Operative Group in Grenoble 6 rue Jules Horowitz, F-38043 Grenoble Cedex, France
Accepted: 19 July 2001
Resonant X-ray scattering measurements on the energy dependence of multilayer Bragg reflections are presented. It is shown that the deviations from the ideal Bragg law at resonance are due to refraction, which allows a determination of the real part of the extended X-ray absorption fine-structure (EXAFS) function. With this new technique, it is possible to obtain phase-sensitive EXAFS information without the difficult data analysis and absorption corrections required by the diffraction anomalous fine-structure technique.
PACS: 61.10.-i – X-ray diffraction and scattering / 78.70.Dm – X-ray absorption spectra / 68.65.-k – Low-dimensional, mesoscopic, and nanoscale systems: structure and nonelectronic properties
© EDP Sciences, 2001
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