| Issue |
Europhys. Lett.
Volume 58, Number 4, May 2002
|
|
|---|---|---|
| Page(s) | 537 - 543 | |
| Section | Condensed matter: structure, mechanical and thermal properties | |
| DOI | https://doi.org/10.1209/epl/i2002-00429-5 | |
| Published online | 01 May 2002 | |
Mound shape instability in multilayer 
homoepitaxy: The role of corner-crossing
INFM, Unità di Ricerca di Genova, Centro CFSBT-CNR
and Dipartimento di Fisica - Via Dodecaneso 33, I-16146
Genova, Italy
Corresponding author: buatier@fisica.unige.it
Received:
2
July
2001
Accepted:
19
February
2002
We have investigated the growth of in the
multilayer regime by high-resolution electron diffraction
(SPA-LEED). 
deposition at temperatures above 180
results in the growth of approximately square mounds with a
predominant 
step termination which is
thermodynamically favored. Surprisingly, when the deposition
temperature is reduced below 130, instead of observing a
random roughening of the step profile, as expected in a
self-affine growth regime, the proliferation of 
oriented facets is observed. We attribute our
observation to the de-activation of corner crossing, as well as
to the presence of easy pathways for interlayer diffusion down
the 
facets which are formed at 
steps.
PACS: 68.55.-a – Thin film structure and morphology / 61.14.Hg – Low-energy electron diffraction (LEED) and reflection high-energy electron diffraction (RHEED) / 68.35.Fx – Diffusion; interface formation
© EDP Sciences, 2002
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