Issue |
Europhys. Lett.
Volume 63, Number 2, July 2003
|
|
---|---|---|
Page(s) | 275 - 281 | |
Section | Condensed matter: structure, mechanical and thermal properties | |
DOI | https://doi.org/10.1209/epl/i2003-00526-5 | |
Published online | 01 November 2003 |
X-ray super-cell crystallography of self-organized deposits
1
Laboratoire Louis Néel (CNRS), UPR5051, BP166 F-38042 Grenoble Cedex 9,
France
2
DRFMC/SP2M/IRS (CEA) - 17 rue des Martyrs, F-38054 Grenoble Cedex 9, France
3
DRECAM/SPCSI (CEA) - 91191 Gif-Sur-Yvette, France
4
Institut de Physique et Chimie des Matériaux de Strasbourg UMR7504 CNRS-Université Louis Pasteur - 23 rue du Loess F-67037 Strasbourg Cedex, France
5
Groupe de Physique du Solide, UMR 7588 - 4 pl. de Jussieu F-75231 Paris Cedex 05, France
Corresponding author: Olivier.Fruchart@grenoble.cnrs.fr
Received:
9
January
2003
Accepted:
22
May
2003
We report in situ Grazing Incidence Small Angle X-ray Scattering (GISAXS), performed on self-organized deposits during growth. The surface reciprocal space associated with the dots periodicity () is investigated. The quantitative combination of GISAXS and STM yields non-destructive information about buried layers. For , a periodic interfacial microstructure persists even after the film free-surface smoothing is observed.
PACS: 68.65.-k – Low-dimensional, mesoscopic, and nanoscale systems: structure and nonelectronic properties / 68.55.Ac – Nucleation and growth: microscopic aspects / 61.10.Eq – X-ray scattering (including small-angle scattering)
© EDP Sciences, 2003
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