Volume 63, Number 2, July 2003
|Page(s)||275 - 281|
|Section||Condensed matter: structure, mechanical and thermal properties|
|Published online||01 November 2003|
X-ray super-cell crystallography of self-organized deposits
Laboratoire Louis Néel (CNRS), UPR5051, BP166 F-38042 Grenoble Cedex 9,
2 DRFMC/SP2M/IRS (CEA) - 17 rue des Martyrs, F-38054 Grenoble Cedex 9, France
3 DRECAM/SPCSI (CEA) - 91191 Gif-Sur-Yvette, France
4 Institut de Physique et Chimie des Matériaux de Strasbourg UMR7504 CNRS-Université Louis Pasteur - 23 rue du Loess F-67037 Strasbourg Cedex, France
5 Groupe de Physique du Solide, UMR 7588 - 4 pl. de Jussieu F-75231 Paris Cedex 05, France
Corresponding author: Olivier.Fruchart@grenoble.cnrs.fr
Accepted: 22 May 2003
We report in situ Grazing Incidence Small Angle X-ray Scattering (GISAXS), performed on self-organized deposits during growth. The surface reciprocal space associated with the dots periodicity () is investigated. The quantitative combination of GISAXS and STM yields non-destructive information about buried layers. For , a periodic interfacial microstructure persists even after the film free-surface smoothing is observed.
PACS: 68.65.-k – Low-dimensional, mesoscopic, and nanoscale systems: structure and nonelectronic properties / 68.55.Ac – Nucleation and growth: microscopic aspects / 61.10.Eq – X-ray scattering (including small-angle scattering)
© EDP Sciences, 2003
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