Issue |
Europhys. Lett.
Volume 63, Number 6, September 2003
|
|
---|---|---|
Page(s) | 833 - 839 | |
Section | Condensed matter: structure, mechanical and thermal properties | |
DOI | https://doi.org/10.1209/epl/i2003-00596-9 | |
Published online | 01 November 2003 |
Wall thickness and core radius determination in surfactant templated silica thin films using GISAXS and X-ray reflectivity
1
Université du Maine, Faculté des Sciences - 72085 Le Mans Cedex 09, France
2
Sandia National Laboratory - Albuquerque, NM 87185, USA
3
University of New Mexico - Albuquerque, NM 87106, USA
4
Brookhaven National Laboratory - Upton Long Island, NY, 11987, USA
Received:
23
January
2003
Accepted:
2
July
2003
X-ray reflectometry and GISAXS (grazing angle small angle scattering) are combined to investigate the morphology and structural parameters of a surfactant templated 2D hexagonal thin-film silica mesophase. It is shown that X-ray reflectivity measurements contain invaluable information about the radius of the cylindrical rods and the distance between their cores. The reflectivity data are analyzed using a model of the electron density and combined with GISAXS measurements to derive the silica wall thickness.
PACS: 61.10.Dp – Theories of diffraction and scattering / 81.07.Bc – Nanocrystalline materials / 68.35.Md – Surface thermodynamics, surface energies
© EDP Sciences, 2003
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