Volume 63, Number 6, September 2003
|Page(s)||833 - 839|
|Section||Condensed matter: structure, mechanical and thermal properties|
|Published online||01 November 2003|
Wall thickness and core radius determination in surfactant templated silica thin films using GISAXS and X-ray reflectivity
Université du Maine, Faculté des Sciences - 72085 Le Mans Cedex 09, France
2 Sandia National Laboratory - Albuquerque, NM 87185, USA
3 University of New Mexico - Albuquerque, NM 87106, USA
4 Brookhaven National Laboratory - Upton Long Island, NY, 11987, USA
Accepted: 2 July 2003
X-ray reflectometry and GISAXS (grazing angle small angle scattering) are combined to investigate the morphology and structural parameters of a surfactant templated 2D hexagonal thin-film silica mesophase. It is shown that X-ray reflectivity measurements contain invaluable information about the radius of the cylindrical rods and the distance between their cores. The reflectivity data are analyzed using a model of the electron density and combined with GISAXS measurements to derive the silica wall thickness.
PACS: 61.10.Dp – Theories of diffraction and scattering / 81.07.Bc – Nanocrystalline materials / 68.35.Md – Surface thermodynamics, surface energies
© EDP Sciences, 2003
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