Volume 65, Number 6, March 2004
|Page(s)||753 - 759|
|Published online||01 March 2004|
Self-organized criticality in the Bean state in thin films
Division of Physics and Astronomy, Vrije Universiteit De Boelelaan 1081, 1081HV Amsterdam, The Netherlands
Accepted: 22 January 2004
The penetration of magnetic flux into a thin film of is studied when the external field is ramped slowly. In this case, the flux penetrates in bursts or avalanches. The size of these avalanches is distributed according to a power law with an exponent of . The additional observation of finite-size scaling of the avalanche distributions, with an avalanche dimension , gives strong indications towards self-organized criticality in this system. Furthermore, we determine exponents governing the roughening dynamics of the flux surface using some universal scaling relations. These exponents are compared to those obtained from a standard roughening analysis.
PACS: 05.65.+b – Self-organized systems / 45.70.Vn – Granular models of complex systems; traffic flow / 74.25.Qt – Vortex lattices, flux pinning, flux creep
© EDP Sciences, 2004
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