| Issue |
Europhys. Lett.
Volume 65, Number 6, March 2004
|
|
|---|---|---|
| Page(s) | 753 - 759 | |
| Section | General | |
| DOI | https://doi.org/10.1209/epl/i2003-10132-1 | |
| Published online | 01 March 2004 | |
Self-organized criticality in the Bean state in
thin films
Division of Physics and Astronomy, Vrije Universiteit De Boelelaan 1081, 1081HV Amsterdam, The Netherlands
Received:
4
August
2003
Accepted:
22
January
2004
The penetration of magnetic flux into a thin film of
is studied when the external field is
ramped slowly. In this case, the flux penetrates in bursts or
avalanches. The size of these avalanches is distributed according
to a power law with an exponent of 
. The
additional observation of finite-size scaling of the avalanche
distributions, with an avalanche dimension 
, gives
strong indications towards self-organized criticality in this
system. Furthermore, we determine exponents governing the
roughening dynamics of the flux surface using some universal
scaling relations. These exponents are compared to those obtained
from a standard roughening analysis.
PACS: 05.65.+b – Self-organized systems / 45.70.Vn – Granular models of complex systems; traffic flow / 74.25.Qt – Vortex lattices, flux pinning, flux creep
© EDP Sciences, 2004
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