| Issue |
Europhys. Lett.
Volume 66, Number 5, June 2004
|
|
|---|---|---|
| Page(s) | 736 - 742 | |
| Section | Condensed matter: electronic structure, electrical, magnetic, and optical properties | |
| DOI | https://doi.org/10.1209/epl/i2003-10248-2 | |
| Published online | 01 May 2004 | |
Magnetic interlayer coupling across
semiconducting 
layers
1
Institut für Festkörperforschung, Forschungszentrum Jülich 52425 Jülich, Germany
2
Fachbereich Physik, Technische Universität Kaiserslautern Erwin-Schrödinger-Straße, 67653 Kaiserslautern, Germany
3
UMR CNRS-Thomson CSF - 91404 Orsay, France
Received:
20
November
2003
Accepted:
26
March
2004
Ferromagnetic interlayer coupling through a semiconducting spacer
has been studied in epitaxial layered structures
. The coupling strength has been determined
as a function of temperature and interlayer thickness using
magneto-optical Kerr effect magnetometry. A strong rise of the
coupling strength with increasing temperature has been observed
in the temperature range, where is paramagnetic. The
observations match the theoretical description of interlayer
exchange coupling between two metallic layers mediated by the
electronic states in a semiconductor. Near the Curie temperature
of , long-range ferromagnetic coupling is observed,
that is related to ferromagnetic order inside the
layer.
PACS: 75.70.Ak – Magnetic properties of monolayers and thin films / 73.40.Sx – Metal-semiconductor-metal structures / 75.70.Cn – Magnetic properties of interfaces (multilayers, superlattices, heterostructures)
© EDP Sciences, 2004
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