Volume 66, Number 5, June 2004
|Page(s)||708 - 714|
|Section||Condensed matter: electronic structure, electrical, magnetic, and optical properties|
|Published online||01 May 2004|
Low-frequency current noise of the single-electron shuttle
Department of Applied Physics, Chalmers University of Technology and Göteborg University - SE-412 96 Göteborg, Sweden
2 Department of Physics, Yale University - P.O. Box 208120 New Haven, CT 06520-8120, USA
Accepted: 30 March 2004
Coupling between electronic and mechanical degrees of freedom in a single-electron shuttle system can cause a mechanical instability leading to shuttle transport of electrons between external leads. We predict that the resulting low-frequency current noise can be enhanced due to slow fluctuations of the shuttle oscillation energy. Moreover, at the onset of mechanical instability a pronounced peak in the low-frequency noise is expected.
PACS: 73.23.Hk – Coulomb blockade; single-electron tunneling / 72.70.+m – Noise processes and phenomena / 85.85.+j – Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
© EDP Sciences, 2004
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