Issue |
Europhys. Lett.
Volume 70, Number 2, April 2005
|
|
---|---|---|
Page(s) | 257 - 263 | |
Section | Condensed matter: electronic structure, electrical, magnetic, and optical properties | |
DOI | https://doi.org/10.1209/epl/i2004-10490-0 | |
Published online | 25 March 2005 |
Matrix analysis of an anisotropic optical thin film
1
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences Shanghai 201800, PRC
2
Graduate School of the Chinese Academy of Sciences - Beijing 100864, PRC
Received:
26
November
2004
Accepted:
9
March
2005
Based on Maxwell's equations, standard boundary conditions are imposed on resultant electric- and magnetic-field vectors at interfaces, and the propagating characteristics of extraordinary waves, such as the forward- and backward-propagating directions of wave vectors, rays and their corresponding refractive indices are determined in a uniaxially birefringent thin film. Furthermore, characteristic matrices of a birefringent thin film are derived including multiple reflections for the extraordinary wave.
PACS: 78.20.Fm – Birefringence / 78.20.Ci – Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity) / 77.55.+f – Dielectric thin films
© EDP Sciences, 2005
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.