Volume 70, Number 2, April 2005
|Page(s)||257 - 263|
|Section||Condensed matter: electronic structure, electrical, magnetic, and optical properties|
|Published online||25 March 2005|
Matrix analysis of an anisotropic optical thin film
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences Shanghai 201800, PRC
2 Graduate School of the Chinese Academy of Sciences - Beijing 100864, PRC
Accepted: 9 March 2005
Based on Maxwell's equations, standard boundary conditions are imposed on resultant electric- and magnetic-field vectors at interfaces, and the propagating characteristics of extraordinary waves, such as the forward- and backward-propagating directions of wave vectors, rays and their corresponding refractive indices are determined in a uniaxially birefringent thin film. Furthermore, characteristic matrices of a birefringent thin film are derived including multiple reflections for the extraordinary wave.
PACS: 78.20.Fm – Birefringence / 78.20.Ci – Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity) / 77.55.+f – Dielectric thin films
© EDP Sciences, 2005
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