Volume 74, Number 1, April 2006
|Page(s)||110 - 116|
|Section||Condensed matter: structural, mechanical and thermal properties|
|Published online||08 March 2006|
Measuring energies with an Atomic Force Microscope
Institut für Chemie und Biochemie, Physikalische und Theoretische Chemie Freie Universität Berlin - D-14195 Berlin, Germany
2 Center of Bioelectronics & Nanobioscience and Departament de Química-Física Universitat de Barcelona - Martí i Franquès 1, E-08028 Barcelona, Spain
3 Institut de Ciència de Materials de Barcelona (ICMAB-CSIC) Campus UAB, E-08193 Bellaterra, Spain
Accepted: 13 February 2006
The elastic and plastic response of ordered inorganic, organic and biological materials involving nanometer-scale volumes in the nano- and low micronewton force range can be characterized by means of an Atomic Force Microscope (AFM) using ultrasharp cantilever tips with radius R typically below . Because the plastic onset can be easily identified, the maximal accumulated elastic energy can be directly determined from the force curves (force F vs. penetration δ curves), thus giving a realistic estimate of the characteristic energies of the materials. We illustrate the ability of AFMs to determine such energies with the case example of the molecular organic metal TTF-TCNQ (TTF = tetrathiafulvalene, TCNQ = tetracyanoquinodimethane), where the enthalpy of sublimation is obtained.
PACS: 68.35.-p – Solid surfaces and solid-solid interfaces: Structure and energetics / 68.37.Ps – Atomic force microscopy (AFM)
© EDP Sciences, 2006
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