Volume 74, Number 4, May 2006
|Page(s)||665 - 671|
|Section||Condensed matter: structural, mechanical and thermal properties|
|Published online||14 April 2006|
Evolution of interface patterns of three-dimensional two-layer liquid films
Lehrstuhl für Theoretische Physik II, Brandenburgische Technische Universität Cottbus - Erich-Weinert-Straße 1, D-03046 Cottbus, Germany
2 Max-Planck-Institut für Physik komplexer Systeme - Nöthnitzer Straße 38 D-01187 Dresden, Germany
Accepted: 27 March 2006
The structuring process of two-layer liquid films driven by van der Waals interactions is investigated numerically for three-dimensional systems. Different types of dynamical transitions of the interface morphologies are characterised using coupled evolution equations for the thickness profiles. We introduce a global deflection measure that faithfully captures the transitions occurring in the course of the short- and long-time evolution. Using an Si/PMMA/PS/air system as example, transitions via branch switching and via coarsening are analysed in detail.
PACS: 68.15.+e – Liquid thin films / 81.16.Rf – Nanoscale pattern formation / 68.55.-a – Thin film structure and morphology
© EDP Sciences, 2006
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