Issue |
EPL
Volume 81, Number 4, February 2008
|
|
---|---|---|
Article Number | 47001 | |
Number of page(s) | 5 | |
Section | Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties | |
DOI | https://doi.org/10.1209/0295-5075/81/47001 | |
Published online | 03 January 2008 |
Metallic nanoparticles detected by infrared spectroscopy
1
Laboratoire de Chimie Physique - Bât. 201P2, Université de Paris Sud, 91405 Orsay cedex, France
2
Laboratoire de Métallurgie-Physique, Université de Poitiers - Bât. SP2MI, BP 30179, 86962 Futuroscope-Chasseneuil Cedex, France
3
Instituto de Ciencia de Materiales de Madrid - Cantoblanco, 28049 Madrid, Spain
4
Centre de Recherches sur les Matériaux à Haute Température - 1D avenue de la recherche scientifique, 45071Orléans Cedex 2, France
Corresponding author: agnes.traverse@u-psud.fr
Received:
1
August
2007
Accepted:
5
December
2007
Small Ni, Cu, Fe, Ag, Pt, Au nanoparticles with average diameters in the nanometer range have been studied by infrared spectroscopy. The Ni, Cu, Fe, Ag, Au nanoparticles were embedded in transparent matrices, AlN or Si3N4, or deposited on Si3N4 in the case of Pt. They were previously characterized by several techniques such as X-ray absorption spectroscopy, grazing incidence small-angle X-ray scattering or transmission electron microscopy. Infrared absorption depending on the metal is detected in the 60 meV to 140 meV energy range. It is interpreted as due to low-energy collective electron excitations related to the 2D confinement occurring at the metal-matrix interface.
PACS: 73.20.-r – Electron states at surfaces and interfaces
© EPLA, 2008
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.