Volume 83, Number 5, September 2008
|Number of page(s)||5|
|Section||Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties|
|Published online||03 September 2008|
New results for the dependence of the magnetoresistance of magnetic multilayers on the layer thickness
School of Physics and Astronomy, E.C. Stoner Laboratory, University of Leeds - Leeds LS2 9JT, UK, EU
2 Department of Physics, Bar-Ilan University - Ramat-Gan, Israel
Corresponding author: email@example.com
Accepted: 20 July 2008
We measured the dependence of the giant magnetoresistance on the thickness of the magnetic layers for a magnetic multilayer comprising two types of magnetic layers, oriented in the CPP mode (current perpendicular to the plane of the layers). The thickness dependence was found to be very different for thin and thick multilayers and for the interleaved and the separated configurations. An explanation for these differences is presented.
PACS: 75.70.Cn – Magnetic properties of interfaces (multilayers, superlattices, heterostructures) / 73.40.-c – Electronic transport in interface structures / 75.47.De – Giant magnetoresistance
© EPLA, 2008
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