Issue |
EPL
Volume 86, Number 4, May 2009
|
|
---|---|---|
Article Number | 47004 | |
Number of page(s) | 5 | |
Section | Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties | |
DOI | https://doi.org/10.1209/0295-5075/86/47004 | |
Published online | 03 June 2009 |
Tuning the patterns of the Fulde-Ferrell-Larkin-Ovchinnikov state by magnetic impurities in d-wave superconductors
1
National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University Nanjing 210093, PRC
2
Cross-Strait Center for Statistical and Theoretical Condensed Matter Physics, Zhejiang Normal University Jinhua 321004, PRC
Corresponding author: xjzuo061@gmail.com
Received:
22
December
2008
Accepted:
30
April
2009
A local structure transition in the Fulde-Ferrell-Larkin-Ovchinnikov (FFLO) state from checkerboard to stripe pattern induced by magnetic impurities is computationally observed in near-optimally doped d-wave superconductors. In the absence of impurities, the checkerboard pattern of the FFLO state is energetically favorable under a parallel field, while a local structure transition to the stripe pattern occurs when strong magnetic impurities are inserted. This finding provides an avenue to tune the patterns of the FFLO state, and is ready to be checked by neutron scattering and nuclear magnetic resonance experiments. The implication for high-Tc cuprate superconductors is discussed.
PACS: 74.20.-z – Theories and models of superconducting state / 74.62.Dh – Effects of crystal defects, doping and substitution / 74.81.-g – Inhomogeneous superconductors and superconducting systems
© EPLA, 2009
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.