Volume 88, Number 3, November 2009
|Number of page(s)||6|
|Section||Condensed Matter: Structural, Mechanical and Thermal Properties|
|Published online||13 November 2009|
X-ray reflectivity reveals equilibrium density profile of molecular liquid under nanometre confinement
Paul Scherrer Institut - 5232 Villigen PSI, Switzerland
2 Université Fribourg - 1700 Fribourg, Switzerland
3 ETH Zürich - 8093 Zürich, Switzerland
4 EMPA - 9014 St. Gallen, Switzerland
Corresponding author: firstname.lastname@example.org
Accepted: 23 October 2009
A silane (tetrakis(trimethylsiloxy)silane) has been confined within a space of a few molecular diameters (9 Å) between two atomically flat opposing mica membranes. The liquid's electron density profile along the confinement direction has been determined by synchrotron X-ray reflectivity for film thicknesses of 8.58 and 11.22 nm. We find the liquid's molecules to be strongly layered at layer distances significantly larger than the effective molecular diameter. The considerable free volume enables the confined liquid to retain its liquid properties.
PACS: 61.25.Em – Molecular liquids / 61.05.cm – X-ray reflectometry (surfaces, interfaces, films) / 68.08.-p – Liquid-solid interfaces
© EPLA, 2009
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