Volume 88, Number 6, December 2009
|Number of page(s)||5|
|Section||Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties|
|Published online||17 December 2009|
Surface vs. bulk electronic structure of silver determined by photoemission
Department of Physics, University of Illinois at Urbana-Champaign - Urbana, IL 61801-3080, USA
2 Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign Urbana, IL 61801-2902, USA
3 Institute of Atomic and Molecular Sciences, Academia Sinica, No. 1, Sec. 4 - Roosevelt Road, Taipei, Taiwan 10617, Republic of China
4 Department of Physics, National Tsing Hua University - 101, Section 2, Kuang-Fu Road, Hsinchu, Taiwan 30013, Republic of China
Accepted: 27 November 2009
Whether photoemission probes surface or bulk properties has long been a topic of interest and debate. This work employs angle-resolved photoemission to map the electronic structure of Ag films of varying thicknesses prepared on Si(111). As expected, the discrete quantum-well states or subbands observed at small thicknesses merge into a continuum as the film thickness approaches the bulk limit. However, a number of discrete states remain isolated within gaps or pockets in the bulk continuum. While these Ag surface states have been predicted previously by calculations, most are experimentally identified herein only for the first time.
PACS: 73.21.Fg – Quantum wells / 73.20.At – Surface states, band structure, electron density of states / 79.60.Dp – Adsorbed layers and thin films
© EPLA, 2009
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.