| Issue |
EPL
Volume 89, Number 2, January 2010
|
|
|---|---|---|
| Article Number | 28001 | |
| Number of page(s) | 6 | |
| Section | Interdisciplinary Physics and Related Areas of Science and Technology | |
| DOI | https://doi.org/10.1209/0295-5075/89/28001 | |
| Published online | 08 February 2010 | |
Generalized Fourier analysis for nanopatterns with overhangs
Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas (INIFTA), Universidad Nacional de La Plata, CONICET - Casilla de Correo 16, Sucursal 4, (1900) La Plata, Argentina
Corresponding author: fcastez@inifta.unlp.edu.ar
Received:
15
August
2009
Accepted:
11
January
2010
We present a new approach to the classic problem of surface-diffusion–driven pattern decay, relevant in nanoscale applications. By means of a generalized Fourier expansion of the pattern shape, considered as a quasiperiodic function, we can very accurately describe the pattern shape during the whole decay process. The approach is especially suitable for those cases in which patterns cannot be described by single-valued functions, i.e. patterns with overhangs. Symmetry considerations on the initial interface can be used to obtain relationships involving the expansion coefficients. Finally, by using a low-order expansion in the case of an initially sinusoidal interface, we obtained the time dependence of the amplitude decay, improving the linear-theory approximation.
PACS: 81.10.Bk – Growth from vapor / 02.50.Ey – Stochastic processes / 81.15.Aa – Theory and models of film growth
© EPLA, 2010
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