Volume 89, Number 6, March 2010
|Number of page(s)||5|
|Section||Condensed Matter: Structural, Mechanical and Thermal Properties|
|Published online||20 April 2010|
Measuring nanoscale stress intensity factors with an atomic force microscope
Laboratoire de Mécanique et Technologie-Cachan, ENS de Cachan/CNRS-UMR 8535/Université Paris 6/PRES
UniverSud Paris - 61 avenue du Président Wilson, F-94235 Cachan Cedex, France, EU
2 Laboratoire des Colloïdes, Verres et Nanomatériaux, Université Montpellier 2, CNRS - Montpellier, France, EU
Accepted: 18 March 2010
Atomic Force Microscopy images of a crack intersecting the free surface of a glass specimen are taken at different stages of subcritical propagation. From the analysis of image pairs, it is shown that a novel Integrated Digital Image Correlation technique allows to measure stress intensity factors in a quantitative fashion. Image sizes as small as 200 nm can be exploited and the surface displacement fields do not show significant deviations from linear elastic solutions down to a 10 nm distance from the crack tip. Moreover, this analysis gives access to the out-of-plane displacement of the free surface at the crack tip.
PACS: 68.37.Ps – Atomic force microscopy (AFM) / 46.50.+a – Fracture mechanics, fatigue and cracks / 07.05.Pj – Image processing
© EPLA, 2010
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