Volume 90, Number 2, April 2010
|Number of page(s)||6|
|Section||Condensed Matter: Structural, Mechanical and Thermal Properties|
|Published online||19 May 2010|
Morphological stability of epitaxy films on pre-strained substrates
CAS Key Laboratory of Mechanical Behavior and Design of Materials, University of Science and Technology of China Hefei, Anhui 230026, PRC
Corresponding author: firstname.lastname@example.org
Accepted: 14 April 2010
We perform a linear stability analysis of coherent epitaxy films on pre-strained substrates by incorporating the effect of long-range forces. We show that a proper pre-strain can increase or decrease the critical thickness and alter the fastest-growing unstable mode of the film. The result may provide a mechanism to control the morphology of the films in a mechanical way.
PACS: 68.55.J- – Morphology of films / 68.35.Ct – Interface structure and roughness / 68.47.Fg – Semiconductor surfaces
© EPLA, 2010
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