| Issue |
EPL
Volume 90, Number 2, April 2010
|
|
|---|---|---|
| Article Number | 26006 | |
| Number of page(s) | 6 | |
| Section | Condensed Matter: Structural, Mechanical and Thermal Properties | |
| DOI | https://doi.org/10.1209/0295-5075/90/26006 | |
| Published online | 19 May 2010 | |
Morphological stability of epitaxy films on pre-strained substrates
CAS Key Laboratory of Mechanical Behavior and Design of Materials, University of Science and Technology of China Hefei, Anhui 230026, PRC
Corresponding author: lhhe@ustc.edu.cn
Received:
4
March
2010
Accepted:
14
April
2010
We perform a linear stability analysis of coherent epitaxy films on pre-strained substrates by incorporating the effect of long-range forces. We show that a proper pre-strain can increase or decrease the critical thickness and alter the fastest-growing unstable mode of the film. The result may provide a mechanism to control the morphology of the films in a mechanical way.
PACS: 68.55.J- – Morphology of films / 68.35.Ct – Interface structure and roughness / 68.47.Fg – Semiconductor surfaces
© EPLA, 2010
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