Volume 92, Number 4, November 2010
|Number of page(s)||6|
|Section||Condensed Matter: Structural, Mechanical and Thermal Properties|
|Published online||06 December 2010|
Selecting the tip electron orbital for scanning tunneling microscopy imaging with sub-ångström lateral resolution
Institute of Solid State Physics RAS - Chernogolovka, Moscow district 142432, Russia
2 Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), School of Physics, Trinity College Dublin - Dublin 2, Ireland, EU
Accepted: 27 October 2010
We report on scanning tunneling microscopy (STM) studies performed with single crystalline W tips on a graphite(0001) surface. Results of distance-dependent STM experiments with sub-ångström lateral resolution and density functional theory electronic structure calculations show how to controllably select one of the tip electron orbitals for high-resolution STM imaging. This is confirmed by experimental images reproducing the shape of the 5dxz, yz and 5dx2−y2 tungsten atomic orbitals. The presented data demonstrate that the application of oriented single crystalline probes can provide further control of spatial resolution and expand the capabilities of STM.
PACS: 68.37.Ef – Scanning tunneling microscopy (including chemistry induced with STM) / 73.40.Gk – Tunneling / 73.20.At – Surface states, band structure, electron density of states
© EPLA, 2010
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