This article has an erratum: [https://doi.org/10.1209/0295-5075/93/69901]
Volume 92, Number 5, December 2010
|Number of page(s)||5|
|Section||Electromagnetism, Optics, Acoustics, Heat Transfer, Classical Mechanics, and Fluid Dynamics|
|Published online||05 January 2011|
Dynamics of complete wetting liquid under evaporation
Laboratoire d'Informatique pour la Mécanique et les Sciences de l'Ingénieur (LIMSI), UPR 3251 du CNRS, Université Paris Sud11 - BP 133, 91403 Orsay cedex, France, EU
2 Laboratoire Matière et Systèmes Complexes (MSC), UMR 7057 CNRS & Université Paris Diderot 10 rue Alice Domon et Léonie Duquet, 75013 Paris, France, EU
3 Laboratoire Physico-chimie des Polymères et Milieux Dispersés (PPMD), UMR 7615 du CNRS, ESPCI 10 rue Vauquelin, 75005 Paris, France, EU
Accepted: 23 November 2010
The dynamics of a contact line under evaporation and total-wetting conditions is studied taking into account van der Waals interactions and the divergent nature of evaporation near the border of the liquid . The existence of a precursor film at the edge of the liquid is shown analytically and numerically. Its length is controlled by the Hamacker constant and evaporative flux. Past the precursor film, Tanner's law is generalized accounting for evaporative effects.
PACS: 47.55.np – Contact lines / 47.15.gm – Thin film flows / 47.55.dr – Interactions with surfaces
© EPLA, 2010
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