Issue |
EPL
Volume 95, Number 2, July 2011
|
|
---|---|---|
Article Number | 27008 | |
Number of page(s) | 5 | |
Section | Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties | |
DOI | https://doi.org/10.1209/0295-5075/95/27008 | |
Published online | 04 July 2011 |
Determining the electron-phonon coupling strength from Resonant Inelastic X-ray Scattering at transition metal L-edges
1
Institute-Lorentz for Theoretical Physics, Universiteit Leiden - 2300 RA Leiden, The Netherlands, EU
2
Institute for Theoretical Solid State Physics, IFW Dresden - D-01171 Dresden, Germany, EU
3
Department of Physics, Northern Illinois University - DeKalb, IL 60115, USA
4
Argonne National Laboratory - 9700 S Cass Ave, Argonne, IL 60439, USA
Received:
29
March
2011
Accepted:
7
June
2011
We show that high-resolution Resonant Inelastic X-ray Scattering (RIXS) provides direct, element-specific and momentum-resolved information on the electron-phonon (e-p) coupling strength. Our theoretical analysis indicates how the e-p coupling can be extracted from RIXS spectra by determining the differential phonon scattering cross-section. An alternative manner to extract the coupling is to use the one- and two-phonon loss ratio, which is governed by the e-p coupling strength and the core-hole lifetime. This allows the determination of the e-p coupling on an absolute energy scale.
PACS: 78.70.Ck – X-ray scattering
© EPLA, 2011
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.