Volume 95, Number 2, July 2011
|Number of page(s)||5|
|Section||Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties|
|Published online||04 July 2011|
Determining the electron-phonon coupling strength from Resonant Inelastic X-ray Scattering at transition metal L-edges
Institute-Lorentz for Theoretical Physics, Universiteit Leiden - 2300 RA Leiden, The Netherlands, EU
2 Institute for Theoretical Solid State Physics, IFW Dresden - D-01171 Dresden, Germany, EU
3 Department of Physics, Northern Illinois University - DeKalb, IL 60115, USA
4 Argonne National Laboratory - 9700 S Cass Ave, Argonne, IL 60439, USA
Accepted: 7 June 2011
We show that high-resolution Resonant Inelastic X-ray Scattering (RIXS) provides direct, element-specific and momentum-resolved information on the electron-phonon (e-p) coupling strength. Our theoretical analysis indicates how the e-p coupling can be extracted from RIXS spectra by determining the differential phonon scattering cross-section. An alternative manner to extract the coupling is to use the one- and two-phonon loss ratio, which is governed by the e-p coupling strength and the core-hole lifetime. This allows the determination of the e-p coupling on an absolute energy scale.
PACS: 78.70.Ck – X-ray scattering
© EPLA, 2011
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