Volume 97, Number 4, February 2012
|Number of page(s)||6|
|Published online||21 February 2012|
Synchronous fluctuation in broad-band processes and application to the electroencephalographic brain data
Department of Mechanical & Industrial Engineering, Ryerson University - Toronto, Canada
2 Department of Paediatrics and Institute of Medical Science, University of Toronto - Toronto, Canada
3 Neuroscience & Mental Health Program, Hospital For Sick Children Research Institute - Toronto, Canada
4 Department of Neurology, Hospital For Sick Children - Toronto, Canada
Accepted: 6 January 2012
We propose phase-like characteristics in the broad-band process and introduce a novel wavelet-based method to analyze fluctuation in synchrony (FIS) in a wide frequency range. We demonstrate FIS between multifractal processes and a modeled dynamical system in phase transition. We then apply the idea to analyze surface scalp electroencephalographic data from normal subjects and traumatic brain-injured (TBI) patients. Our results show that FIS in normal subjects is more pronounced and exhibits more dynamic spatiotemporal patterns. Moreover, we find an intrinsic synchrony-variability relationship underlying these FIS characteristics.
PACS: 05.45.Tp – Time series analysis / 05.45.Xt – Synchronization; coupled oscillators / 87.19.lm – Synchronization in the nervous system
© EPLA, 2012
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