Volume 102, Number 6, June 2013
|Number of page(s)||6|
|Section||Condensed Matter: Structural, Mechanical and Thermal Properties|
|Published online||02 July 2013|
Tracking competitive lattice distortions in strongly correlated VO2-based systems: A temperature-dependent EXAFS study
1 European Synchrotron Radiation Facility - BP 220, 38043 Grenoble Cedex, France, EU
2 Dipartimento di Fisica, Università di Roma Sapienza - P.le Aldo Moro 2, 00185 Roma, Italy, EU
3 Dipartimento di Chimica, Università di Pavia - Via Taramelli, 27100 Pavia, Italy, EU
Received: 10 March 2013
Accepted: 2 June 2013
Temperature-driven phase transitions of V1−xCrxO2 (with x = 0.00 and 0.007) have been studied by means of vanadium K-edge X-ray absorption spectroscopy between 50 and 350 K. X-ray absorption near-edge structure (XANES) reveals the electronic changes occurring across the metal-insulator transition at ∼350 K. Extended X-ray absorption fine structure (EXAFS) spectroscopy enlightens the modification occuring to the VO6 octahedra across the different monoclinic (M1, M2, M3) and rutile (R) structures. The EXAFS results provide a complete local structural characterization of the competing lower-symmetry phases of the V1−xCrxO2 (with x = 0.00 and 0.007) and shed light on the major role of lattice relaxation energy in the degradation properties of several devices based on the metal-insulator transition.
PACS: 61.05.cj – X-ray absorption spectroscopy: EXAFS, NEXAFS, XANES, etc. / 71.30.+h – Metal-insulator transitions and other electronic transitions / 64.70.K- – Solid-solid transitions
© EPLA, 2013
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