| Issue |
EPL
Volume 103, Number 6, September 2013
|
|
|---|---|---|
| Article Number | 61001 | |
| Number of page(s) | 6 | |
| Section | The Physics of Elementary Particles and Fields | |
| DOI | https://doi.org/10.1209/0295-5075/103/61001 | |
| Published online | 22 October 2013 | |
Critical scaling in random-field systems: 2 or 3 independent exponents?
1 LPTMC, CNRS- UMR 7600, Université Pierre et Marie Curie - boîte 121, 4 Pl. Jussieu, 75252 Paris cédex 05, France, EU
2 Institute of Physics - P.O. Box 304, Bijenička cesta 46, HR-10001 Zagreb, Croatia
Received: 15 April 2013
Accepted: 18 September 2013
We show that the critical scaling behavior of random-field systems with short-range interactions and disorder correlations cannot be described in general by only two independent exponents, contrary to previous claims. This conclusion is based on a theoretical description of the whole 
domain of the d-dimensional random-field O(N) model (RFO(N)M) and points to the role of rare events that are overlooked by the proposed derivations of two-exponent scaling. Quite strikingly, however, the numerical estimates of the critical exponents of the random-field Ising model are extremely close to the predictions of the two-exponent scaling in d = 3 and d = 4, so that the issue cannot be decided only on the basis of numerical simulations in these spatial dimensions.
PACS: 11.10.Hi – Renormalization group evolution of parameters / 75.40.Cx – Static properties (order parameter, static susceptibility, heat capacities, critical exponents, etc.)
© EPLA, 2013
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.