Volume 104, Number 6, December 2013
|Number of page(s)||6|
|Section||Condensed Matter: Structural, Mechanical and Thermal Properties|
|Published online||14 January 2014|
Correction for beam attenuation and indirect excitation in x-ray fluorescence holography
Institute of Physics, Jagiellonian University - Reymonta 4, 30-059 Kraków, Poland
(a) firstname.lastname@example.org (corresponding author)
Received: 17 September 2013
Accepted: 13 December 2013
The influence of beam attenuation (BA) and indirect excitation (IE) processes on atomic resolved imaging with x-ray fluorescence holography (XFH) is considered. It is shown that these processes can influence element sensitivity, the key feature of XFH. A model which allows one to correct for BA and IE is proposed and verified experimentally.
PACS: 61.05.C- – X-ray diffraction and scattering / 42.40.-i – Holography / 78.70.En – X-ray emission spectra and fluorescence
© EPLA, 2013
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