| Issue |
EPL
Volume 107, Number 6, September 2014
|
|
|---|---|---|
| Article Number | 67001 | |
| Number of page(s) | 5 | |
| Section | Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties | |
| DOI | https://doi.org/10.1209/0295-5075/107/67001 | |
| Published online | 09 September 2014 | |
Switching current distributions in Josephson junctions at very low temperatures
1 Physics & Computer Science, Wilfrid Laurier University - Waterloo, Ontario, Canada
2 Dipartimento di Fisica and MINAS- Lab, Università di Roma “Tor Vergata” - I-00133 Roma, Italy
3 Department of Applied Science, University of California - Davis, CA 95616, USA
Received: 4 April 2014
Accepted: 22 August 2014
Swept bias experiments carried out on Josephson junctions yield the distributions of the probabilities of early switching from the zero-voltage state. Kramers' theory of the thermally activated escape from a one-dimensional potential is well known to fall short of explaining such experiments when the junctions are at millikelvin temperatures. We propose a simple revision of the theory which is shown to give extremely good agreement with experimental data.
PACS: 74.50.+r – Tunneling phenomena; Josephson effects / 85.25.Cp – Josephson devices / 03.67.Lx – Quantum computation architectures and implementations
© EPLA, 2014
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