Volume 109, Number 2, January 2015
|Number of page(s)||5|
|Section||Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties|
|Published online||03 February 2015|
Investigation of surface and bulk charge traps of polyimide film by using the photo-stimulated discharge method
1 Department of Electrical Engineering, Tongji University - Shanghai 201804, China
2 Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, Department of Physics, Tongji University - Shanghai 200092, China
3 Key Laboratory of Engineering Dielectrics and Its Application, Ministry of Education, Harbin University of Science and Technology - Harbin 150080, China
Received: 7 July 2014
Accepted: 10 January 2015
The spatial distribution of the charge trap depths in polyimide films was investigated by the photo-stimulated discharge (PSD) method. The charges were implanted by corona charging or electron beam irradiation. The characterizations of the PSD spectra regularly varied with the corona charging durations and the electron beam irradiation with different energy was adopted to find out the cause of the change. The experimental results show that the trap depths have a non-uniform spatial distribution along the thickness direction in polyimide films.
PACS: 72.20.Jv – Charge carriers: generation, recombination, lifetime, and trapping / 52.80.Hc – Glow; corona / 41.75.Fr – Electron and positron beams
© EPLA, 2015
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