Adsorption-induced strain of a nanoscale silicon honeycomb

¹ Institut des NanoSciences de Paris, CNRS, UPMC Univ. Paris 6 - 4, place Jussieu, 75005 Paris, France
² Interfaces, Confinement, Matériaux et Nanostructures, CNRS UMR7374, Université d'Orléans 1b rue de la Férollerie, 45071 Orléans cedex 02, France
³ Laboratoire de Physique Statistique de l'ENS, associé au CNRS et aux Universités Paris 6 et Paris 7 24 rue Lhomond, 75005 Paris, France

Received: 5 December 2014
Accepted: 25 February 2015

Abstract

We report on systematic measurements of both adsorption and anisotropic mechanical deformations of mesoporous silicon, using heptane at room temperature. Porous Si obtained from highly doped (100) Si can be thought of as a nanoscale random honeycomb with pores parallel to the [001] axis. We show that strains and measured along and transversely to the pore axis exhibit a hysteretic behavior as a function of the fluid pressure, which is due to the hysteresis in fluid adsorption. The pressure dependence of the strains together with the independent measurement of the transverse stress, allows us to determine the biaxial transverse modulus and to estimate the longitudinal Young's modulus of porous Si. We argue that the value of these constants implies that Young's modulus of the 6 nm thick walls of the honeycomb is about 5 times smaller than that of bulk silicon, striking evidence of finite-size effects.