Issue |
EPL
Volume 110, Number 4, May 2015
|
|
---|---|---|
Article Number | 47001 | |
Number of page(s) | 6 | |
Section | Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties | |
DOI | https://doi.org/10.1209/0295-5075/110/47001 | |
Published online | 28 May 2015 |
Effects of LC shunting on the Shapiro steps features of Josephson junction
1 BLTP, JINR - Dubna, Moscow Region, 141980, Russia
2 International University of Dubna - Dubna, Moscow Region 141980, Russia
3 Umarov Physical Technical Institute, TAS - Dushanbe, 734063 Tajikistan
4 Institut für Festkörperphysik, Friedrich Schiller Universität - Jena, D-07743 Jena, Germany
Received: 2 February 2015
Accepted: 7 May 2015
We study an effect of external radiation on the dynamics of Josephson junction shunted by an LC circuit. When the Josephson frequency is equal to the frequency of the circuit, additional stable resonant circuit branches appear in the IV-characteristic of the junction. The branches occur on the stable side of a narrow resonance peak, while the other peak side has a negative slope and is unstable. We show that the amplitude dependence of the Shapiro step width crucially changes when the Shapiro step is on the resonant circuit branch. These effects might give very important advantages for methods and technologies that exploit the response of Josephson junctions to microwave fields.
PACS: 74.50.+r – Tunneling phenomena; Josephson effects / 85.25.-j – Superconducting devices / 85.25.Cp – Josephson devices
© EPLA, 2015
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