| Issue |
EPL
Volume 113, Number 2, January 2016
|
|
|---|---|---|
| Article Number | 27004 | |
| Number of page(s) | 4 | |
| Section | Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties | |
| DOI | https://doi.org/10.1209/0295-5075/113/27004 | |
| Published online | 08 February 2016 | |
A novel approach to normalize Compton profiles of pure incoherent scatterers
Department of Studies in Physics, University of Mysore - Manasagangotri, Mysuru, Karnataka, India-570006, India
Received: 18 November 2015
Accepted: 25 January 2016
In this paper we show that the effective atomic number of amorphous materials which can be treated as pure incoherent scatterers can itself be used as a constant for normalizing the experimental Compton profiles. This finding is expected to be useful since calculation of the normalization constant by the usual procedure of integrating the Biggs et al. Compton profile values is a tedious task for composite materials. This method is applicable to pure incoherent scatterers of known as well as unknown composition.
PACS: 78.70.-g – Interactions of particles and radiation with matter
© EPLA, 2016
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