Issue |
EPL
Volume 114, Number 1, April 2016
|
|
---|---|---|
Article Number | 17003 | |
Number of page(s) | 5 | |
Section | Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties | |
DOI | https://doi.org/10.1209/0295-5075/114/17003 | |
Published online | 21 April 2016 |
Unambiguous magnetoelastic effect on residual anisotropy in thin films deposited on flexible substrates
1 LSPM-CNRS, Université Paris 13-Sorbonne Paris Cité - F-93430, Villetaneuse, France
2 Information Storage Materials Laboratory, Department of Electrical and Computer Engineering, National University of Singapore - 117576 Singapore
(a) zighem@univ-paris13.fr
(b) faurie@univ-paris13.fr
(c) eleaao@nus.edu.sg
Received: 7 January 2016
Accepted: 11 April 2016
The residual magnetic uniaxial anisotropy of thin films deposited on flexible substrates was studied to elucidate its main origins. For that purpose, we sputtered 20 nm thick films of Co40Fe40B20 and Ni80Fe20 on Kapton® substrates. After measuring magnetomechanical properties of each system, we have shown that the weak residual anisotropy in the Ni80Fe20 film, compared to that of Co40Fe40B20, is perfectly correlated to its low magnetostriction coefficient. As a consequence, we conclude that this residual anisotropy is undoubtedly due to the unavoidable bending of the system, even if it is invisible with the naked eye (radius of several centimeters).
PACS: 75.30.Gw – Magnetic anisotropy / 76.50.+g – Ferromagnetic, antiferromagnetic, and ferrimagnetic resonances; spin-wave resonance / 75.70.-i – Magnetic properties of thin films, surfaces, and interfaces
© EPLA, 2016
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