Volume 119, Number 3, August 2017
|Number of page(s)||7|
|Section||Interdisciplinary Physics and Related Areas of Science and Technology|
|Published online||10 October 2017|
Advanced electron tomography of nanoparticle assemblies(a)
EMAT, University of Antwerp - Groenenborgerlaan 171, B-2020 Antwerp, Belgium
Received: 19 July 2017
Accepted: 22 September 2017
Nanoparticle assemblies have attracted enormous scientific interest during the last years, due to their unique properties compared to those of their building blocks. To understand the origin of these properties and to establish the connection with their structure, a detailed and quantitative structural characterization is essential. Transmission electron microscopy has been widely used to investigate nano-assemblies. However, TEM images only correspond to a two-dimensional projection of a three-dimensional object. Therefore, in order to obtain the necessary 3D structural information electron tomography has to be applied. By means of advanced electron tomography, both qualitative and quantitative information can be obtained, which can be used for detailed theoretical studies.
PACS: 87.64.Ee – Electron microscopy / 81.16.Dn – Self-assembly / 81.70.Tx – Computed tomography
© EPLA, 2017
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