Volume 120, Number 1, October 2017
|Number of page(s)||6|
|Section||Condensed Matter: Structural, Mechanical and Thermal Properties|
|Published online||18 December 2017|
Roughening of a stepped GaN grain boundary with increasing driving force for migration
1 Department of Materials Science and Engineering and Research Institute of Advanced Materials (RIAM) Seoul National University, Seoul 08826, South Korea
2 Electron Microscopy Research Center, Korea Basic Science Institute - Daejeon 34133, South Korea
3 Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research Heisenbergstraße 1, 70569 Stuttgart, Germany
Received: 10 October 2017
Accepted: 19 November 2017
High-resolution transmission electron microscopy is applied to characterize the structure of a GaN grain boundary, which is subjected to the driving force for migration arising from the surface energy anisotropy during annealing at 500 °C in a transmission electron microscope. At a low driving force for migration, the grain boundary consists of atomically flat terrace regions interrupted by steps. As the driving force increases, grain-boundary steps become more frequent and undergo meandering, which is a typical attribute of kinetic roughening transition.
PACS: 68.35.Ja – Surface and interface dynamics and vibrations / 61.72.Mm – Grain and twin boundaries / 68.37.Og – High-resolution transmission electron microscopy (HRTEM)
© EPLA, 2017
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