Issue |
EPL
Volume 120, Number 1, October 2017
|
|
---|---|---|
Article Number | 16002 | |
Number of page(s) | 6 | |
Section | Condensed Matter: Structural, Mechanical and Thermal Properties | |
DOI | https://doi.org/10.1209/0295-5075/120/16002 | |
Published online | 18 December 2017 |
Roughening of a stepped GaN grain boundary with increasing driving force for migration
1 Department of Materials Science and Engineering and Research Institute of Advanced Materials (RIAM) Seoul National University, Seoul 08826, South Korea
2 Electron Microscopy Research Center, Korea Basic Science Institute - Daejeon 34133, South Korea
3 Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research Heisenbergstraße 1, 70569 Stuttgart, Germany
(a) bolee@snu.ac.kr
Received: 10 October 2017
Accepted: 19 November 2017
High-resolution transmission electron microscopy is applied to characterize the structure of a GaN grain boundary, which is subjected to the driving force for migration arising from the surface energy anisotropy during annealing at 500 °C in a transmission electron microscope. At a low driving force for migration, the grain boundary consists of atomically flat terrace regions interrupted by steps. As the driving force increases, grain-boundary steps become more frequent and undergo meandering, which is a typical attribute of kinetic roughening transition.
PACS: 68.35.Ja – Surface and interface dynamics and vibrations / 61.72.Mm – Grain and twin boundaries / 68.37.Og – High-resolution transmission electron microscopy (HRTEM)
© EPLA, 2017
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