Volume 131, Number 1, July 2020
|Number of page(s)||6|
|Published online||05 August 2020|
Calibrated force measurement in atomic force microscopy using the transient fluctuation theorem
Univ Lyon, Ens de Lyon, Univ Claude Bernard, CNRS, Laboratoire de Physique, UMR 5672 - F-69342 Lyon, France
Received: 19 May 2020
Accepted: 3 July 2020
The transient fluctuation theorem is used to calibrate an atomic force microscope by measuring the fluctuations of the work performed by a time-dependent force applied between a colloidal probe and the surface. From this measure one can easily extract the value of the interaction force and the relevant parameters of the cantilever. The results of this analysis are compared with those obtained by standard calibration methods.
PACS: 07.10.Fq – Vibration isolation / 05.40.Ca – Noise
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