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Europhys. Lett., 50 6 (2000) 742-748

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[Your name] recommends the following article:

Scanning force microscopy corrected for -scale sample elasticity on single latent heavy-ion tracks in polymers

F. Ohnesorge and R. Neumann

Europhys. Lett., 50 6 (2000) 742-748

Published online: 01 September 2002

DOI: https://doi.org/10.1209/epl/i2000-00543-x

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