EPL

The stability of tin silicon oxide thin-film transistors with different annealing temperatures

Jianwen Yang, Ruofan Fu, Yanbing Han, Ting Meng and Qun Zhang

EPL, 115 2 (2016) 28006

Published online: 30 August 2016

DOI: 10.1209/0295-5075/115/28006

Jianwen Yang

Ruofan Fu

Yanbing Han

Ting Meng

Qun Zhang

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